CVE-2025-24206

HIGHCVSS 7.7/10EPSS 0.34%

Last modified

CVE-2025-24206 is a high-severity vulnerability rated 7.7/10 on the CVSS scale. An authentication issue was addressed with improved state management. This issue is fixed in iOS 18.4 and iPadOS 18.4, iPadOS 17.7.6, macOS Sequoia 15.4, macOS Sonoma 14.7.5, macOS Ventura 13.7.5, tvOS 18.4, visionOS 2.4. EPSS estimates a 0.34% chance of exploitation in the next 30 days.

Description

An authentication issue was addressed with improved state management. This issue is fixed in iOS 18.4 and iPadOS 18.4, iPadOS 17.7.6, macOS Sequoia 15.4, macOS Sonoma 14.7.5, macOS Ventura 13.7.5, tvOS 18.4, visionOS 2.4. An attacker on the local network may be able to bypass authentication policy.

Metrics

CVSS 3.1
7.7/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:N

EPSS Probability
0.34%

26.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AppleIpados< 17.7.6
AppleIpados>= 18.0, < 18.4
AppleIphone Os< 18.4
AppleMacos< 13.7.5
AppleMacos>= 14.0, < 14.7.5
AppleMacos>= 15.0, < 15.4
AppleTvos< 18.4
AppleVisionos< 2.4

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2025-24206?
An authentication issue was addressed with improved state management. This issue is fixed in iOS 18.4 and iPadOS 18.4, iPadOS 17.7.6, macOS Sequoia 15.4, macOS Sonoma 14.7.5, macOS Ventura 13.7.5, tvOS 18.4, visionOS 2.4. An attacker on the local network may be able to bypass authentication policy.
How severe is CVE-2025-24206?
CVE-2025-24206 has a CVSS score of 7.7/10 (HIGH severity). The EPSS model estimates a 0.34% probability of exploitation in the next 30 days.
How do I fix CVE-2025-24206?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-24206?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST