CVE-2025-32347

Name: CVE-2025-32347
Creator: NVD / NIST
Published: 2025-09-04T19:15:37.437+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.8/10EPSS 0.08%

Last modified Jun 17, 2026

CVE-2025-32347 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. In onStart of BiometricEnrollIntroduction.java, there is a possible way to determine the device's location due to an unsafe PendingIntent. This could lead to local escalation of privilege with no additional execution privileges needed. EPSS estimates a 0.08% chance of exploitation in the next 30 days.

Description

In onStart of BiometricEnrollIntroduction.java, there is a possible way to determine the device's location due to an unsafe PendingIntent. This could lead to local escalation of privilege with no additional execution privileges needed. User interaction is needed for exploitation.

Metrics

CVSS 3.1

7.8/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

0.08%

0.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-926

Affected Software

Vendor	Product	Versions
Google	Android	13.0
Google	Android	14.0
Google	Android	15.0
Google	Android	16.0

References

https://android.googlesource.com/platform/packages/apps/Settings/+/25cfacbe5ac2423b8fe1375e0593ef69e98b8d09Patch, Product
https://source.android.com/security/bulletin/2025-09-01Vendor Advisory

Timeline

Published: Sep 4, 2025
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2025-32347?

How severe is CVE-2025-32347?

CVE-2025-32347 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.08% probability of exploitation in the next 30 days.

How do I fix CVE-2025-32347?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-32347?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST