CVE-2025-3571

MEDIUMCVSS 5.3/10EPSS 0.26%

Last modified

CVE-2025-3571 is a medium-severity vulnerability rated 5.3/10 on the CVSS scale. A vulnerability was found in Fannuo Enterprise Content Management System 凡诺企业网站管理系统 1.1/4.0. It has been declared as critical. EPSS estimates a 0.26% chance of exploitation in the next 30 days.

Description

A vulnerability was found in Fannuo Enterprise Content Management System 凡诺企业网站管理系统 1.1/4.0. It has been declared as critical. This vulnerability affects unknown code of the file admin/cms_chip.php. The manipulation of the argument del leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used.

Metrics

CVSS 3.1
6.3/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:L/I:L/A:L

CVSS 4.0
5.3/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:L/UI:N/VC:L/VI:L/VA:L/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.26%

17.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2025-3571?
A vulnerability was found in Fannuo Enterprise Content Management System 凡诺企业网站管理系统 1.1/4.0. It has been declared as critical. This vulnerability affects unknown code of the file admin/cms_chip.php. The manipulation of the argument del leads to sql injection. The attack can be initiated remotely. The exploit has been disclosed to the public and may be used.
How severe is CVE-2025-3571?
CVE-2025-3571 has a CVSS score of 5.3/10 (MEDIUM severity). The EPSS model estimates a 0.26% probability of exploitation in the next 30 days.
How do I fix CVE-2025-3571?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-3571?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST