CVE-2025-37171

HIGHCVSS 7.2/10EPSS 1.20%

Last modified

CVE-2025-37171 is a high-severity vulnerability rated 7.2/10 on the CVSS scale. Authenticated command injection vulnerabilities exist in the web-based management interface of mobility conductors running AOS-8 operating system. Successful exploitation could allow an authenticated malicious actor to execute arbitrary commands as a privileged user on the underlying operating system.. EPSS estimates a 1.20% chance of exploitation in the next 30 days.

Description

Authenticated command injection vulnerabilities exist in the web-based management interface of mobility conductors running AOS-8 operating system. Successful exploitation could allow an authenticated malicious actor to execute arbitrary commands as a privileged user on the underlying operating system.

Metrics

CVSS 3.1
7.2/10

CVSS:3.1/AV:N/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.20%

64.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ArubanetworksArubaos>= 8.6.0.0, < 8.10.0.21
ArubanetworksArubaos>= 8.11.0.0, < 8.13.1.1

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-37171?
Authenticated command injection vulnerabilities exist in the web-based management interface of mobility conductors running AOS-8 operating system. Successful exploitation could allow an authenticated malicious actor to execute arbitrary commands as a privileged user on the underlying operating system.
How severe is CVE-2025-37171?
CVE-2025-37171 has a CVSS score of 7.2/10 (HIGH severity). The EPSS model estimates a 1.20% probability of exploitation in the next 30 days.
How do I fix CVE-2025-37171?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-37171?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST