CVE-2025-40803

Name: CVE-2025-40803
Creator: NVD / NIST
Published: 2025-09-09T09:15:38.693+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

LOWCVSS 2.3/10EPSS 0.16%

Last modified Jun 17, 2026

CVE-2025-40803 is a low-severity vulnerability rated 2.3/10 on the CVSS scale. A vulnerability has been identified in RUGGEDCOM RST2428P (6GK6242-6PA00) (All versions). The affected device exposes certain non-critical information from the device. EPSS estimates a 0.16% chance of exploitation in the next 30 days.

Description

A vulnerability has been identified in RUGGEDCOM RST2428P (6GK6242-6PA00) (All versions). The affected device exposes certain non-critical information from the device. This could allow an unauthenticated attacker to access sensitive data, potentially leading to a breach of confidentiality.

Metrics

CVSS 3.1

3.1/10

CVSS:3.1/AV:A/AC:H/PR:N/UI:N/S:U/C:L/I:N/A:N

CVSS 4.0

2.3/10

CVSS:4.0/AV:A/AC:H/AT:N/PR:N/UI:N/VC:L/VI:N/VA:N/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability

0.16%

5.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-200

Affected Software

Vendor	Product	Versions
Siemens	Ruggedcom Rst2428p Firmware	All versions

References

https://cert-portal.siemens.com/productcert/html/ssa-494539.htmlVendor Advisory

Timeline

Published: Sep 9, 2025
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2025-40803?

How severe is CVE-2025-40803?

CVE-2025-40803 has a CVSS score of 2.3/10 (LOW severity). The EPSS model estimates a 0.16% probability of exploitation in the next 30 days.

How do I fix CVE-2025-40803?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-40803?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST