CVE-2025-4173

HIGHCVSS 8.8/10EPSS 0.39%

Last modified

CVE-2025-4173 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. A vulnerability classified as critical was found in SourceCodester Online Eyewear Shop 1.0. Affected by this vulnerability is the function delete_cart of the file /oews/classes/Master.php?f=delete_cart. EPSS estimates a 0.39% chance of exploitation in the next 30 days.

Description

A vulnerability classified as critical was found in SourceCodester Online Eyewear Shop 1.0. Affected by this vulnerability is the function delete_cart of the file /oews/classes/Master.php?f=delete_cart. The manipulation of the argument ID leads to sql injection. The attack can be launched remotely. The exploit has been disclosed to the public and may be used.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

CVSS 4.0
5.3/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:L/UI:N/VC:L/VI:L/VA:L/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.39%

30.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Oretnom23Online Eyewear Shop1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-4173?
A vulnerability classified as critical was found in SourceCodester Online Eyewear Shop 1.0. Affected by this vulnerability is the function delete_cart of the file /oews/classes/Master.php?f=delete_cart. The manipulation of the argument ID leads to sql injection. The attack can be launched remotely. The exploit has been disclosed to the public and may be used.
How severe is CVE-2025-4173?
CVE-2025-4173 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 0.39% probability of exploitation in the next 30 days.
How do I fix CVE-2025-4173?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

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Source: NVD / NIST