CVE-2025-44526

Name: CVE-2025-44526
Creator: NVD / NIST
Published: 2025-07-09T16:15:23.563+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

MEDIUMCVSS 6.5/10EPSS 0.36%

Last modified Jun 17, 2026

CVE-2025-44526 is a medium-severity vulnerability rated 6.5/10 on the CVSS scale. Realtek RTL8762EKF-EVB RTL8762E SDK V1.4.0 was discovered to utilize insufficient permission checks on critical fields within Bluetooth Low Energy (BLE) data packets. This issue allows attackers to cause a Denial of Service (DoS) via a crafted LL_Length_Req packet.. EPSS estimates a 0.36% chance of exploitation in the next 30 days.

Description

Realtek RTL8762EKF-EVB RTL8762E SDK V1.4.0 was discovered to utilize insufficient permission checks on critical fields within Bluetooth Low Energy (BLE) data packets. This issue allows attackers to cause a Denial of Service (DoS) via a crafted LL_Length_Req packet.

Metrics

CVSS 3.1

6.5/10

CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability

0.36%

27.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Vendor	Product	Versions
Realtek	Rtl8762e Software Development Kit	1.4.0

References

http://realtek.comBroken Link
http://rtl8762ekf-evb.comBroken Link
https://github.com/yangting111/BLE_TEST/blob/main/result/PoC/Realtek/Improper_Validation_of_BLE_PDU_Length.mdExploit, Third Party Advisory

Timeline

Published: Jul 9, 2025
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2025-44526?

How severe is CVE-2025-44526?

CVE-2025-44526 has a CVSS score of 6.5/10 (MEDIUM severity). The EPSS model estimates a 0.36% probability of exploitation in the next 30 days.

How do I fix CVE-2025-44526?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-44526?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST