CVE-2025-53170
MEDIUMCVSS 5.5/10EPSS 0.09%
Last modified
CVE-2025-53170 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. Null pointer dereference vulnerability in the application exit cause module Impact: Successful exploitation of this vulnerability may affect function stability.. EPSS estimates a 0.09% chance of exploitation in the next 30 days.
Description
Null pointer dereference vulnerability in the application exit cause module Impact: Successful exploitation of this vulnerability may affect function stability.
Metrics
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Huawei | Harmonyos | 5.1.0 |
References
- https://consumer.huawei.com/en/support/bulletin/2025/7/Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Analyzed
Frequently Asked Questions
What is CVE-2025-53170?
Null pointer dereference vulnerability in the application exit cause module
Impact: Successful exploitation of this vulnerability may affect function stability.
How severe is CVE-2025-53170?
CVE-2025-53170 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.09% probability of exploitation in the next 30 days.
How do I fix CVE-2025-53170?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
- AI Penetration TestingHow AI-driven penetration testing continuously covers your attack surface.
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Are you affected by CVE-2025-53170?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST