CVE-2025-54496
HIGHCVSS 8.4/10EPSS 0.16%
Last modified
CVE-2025-54496 is a high-severity vulnerability rated 8.4/10 on the CVSS scale. A maliciously crafted project file may cause a heap-based buffer overflow in Fuji Electric Monitouch V-SFT-6, which may allow the attacker to execute arbitrary code.. EPSS estimates a 0.16% chance of exploitation in the next 30 days.
Description
A maliciously crafted project file may cause a heap-based buffer overflow in Fuji Electric Monitouch V-SFT-6, which may allow the attacker to execute arbitrary code.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Fujielectric | Monitouch V-Sft | >= 6.2.7.0, < 6.2.9.0 |
References
- https://www.cisa.gov/news-events/ics-advisories/icsa-25-308-01Third Party Advisory, US Government Resource
Timeline
- Published
- Last Modified
- Status
- Analyzed
Frequently Asked Questions
What is CVE-2025-54496?
A maliciously crafted project file may cause a heap-based buffer
overflow in
Fuji Electric Monitouch V-SFT-6, which may allow the attacker to execute arbitrary code.
How severe is CVE-2025-54496?
CVE-2025-54496 has a CVSS score of 8.4/10 (HIGH severity). The EPSS model estimates a 0.16% probability of exploitation in the next 30 days.
How do I fix CVE-2025-54496?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
- AI Penetration TestingHow AI-driven penetration testing continuously covers your attack surface.
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Are you affected by CVE-2025-54496?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST