CVE-2025-56130

Name: CVE-2025-56130
Creator: NVD / NIST
Published: 2025-12-11T19:15:58.133+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 8.8/10EPSS 1.81%

Last modified Jun 17, 2026

CVE-2025-56130 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. OS Command Injection vulnerability in Ruijie RG-S1930 S1930SWITCH_3.0(1)B11P230 allowing attackers to execute arbitrary commands via a crafted POST request to the module_update in file /usr/local/lua/dev_config/ace_sw.lua.. EPSS estimates a 1.81% chance of exploitation in the next 30 days.

Description

OS Command Injection vulnerability in Ruijie RG-S1930 S1930SWITCH_3.0(1)B11P230 allowing attackers to execute arbitrary commands via a crafted POST request to the module_update in file /usr/local/lua/dev_config/ace_sw.lua.

Metrics

CVSS 3.1

8.8/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

1.81%

75.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-78

Affected Software

Vendor	Product	Versions
Ruijie	Rg-Nbs5100-24gt4sfp Firmware	3.0\(1\)b11p248
Ruijie	Rg-S1930 Firmware	3.0\(1\)b11p230

References

https://1drv.ms/f/c/12406a392c92914b/EpWU9cQdd5RNszcYlTj2cGsBfiClkCwF0zCsLNYer2VIZA?e=ANIgPMProduct
https://github.com/flegoity/Ruijie-Multiple-Devices-Vulnerability-Reports-for-CVE/blob/main/CVE-2025-56130.mdExploit, Third Party Advisory

Timeline

Published: Dec 11, 2025
Last Modified: Jun 17, 2026
Status: Analyzed

Frequently Asked Questions

What is CVE-2025-56130?

How severe is CVE-2025-56130?

CVE-2025-56130 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 1.81% probability of exploitation in the next 30 days.

How do I fix CVE-2025-56130?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-56130?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST