CVE-2025-57529

CRITICALCVSS 9.8/10EPSS 0.56%

Last modified

CVE-2025-57529 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. YouDataSum CPAS Audit Management System <=v4.9 is vulnerable to SQL Injection in /cpasList/findArchiveReportByDah due to insufficient input validation. This allows remote unauthenticated attackers to execute arbitrary SQL commands via crafted input to the parameter. EPSS estimates a 0.56% chance of exploitation in the next 30 days.

Description

YouDataSum CPAS Audit Management System <=v4.9 is vulnerable to SQL Injection in /cpasList/findArchiveReportByDah due to insufficient input validation. This allows remote unauthenticated attackers to execute arbitrary SQL commands via crafted input to the parameter. Successful exploitation could lead to unauthorized data access

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
0.56%

42.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
YoudatasumCpas Audit Management System<= 4.9

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-57529?
YouDataSum CPAS Audit Management System <=v4.9 is vulnerable to SQL Injection in /cpasList/findArchiveReportByDah due to insufficient input validation. This allows remote unauthenticated attackers to execute arbitrary SQL commands via crafted input to the parameter. Successful exploitation could lead to unauthorized data access
How severe is CVE-2025-57529?
CVE-2025-57529 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.56% probability of exploitation in the next 30 days.
How do I fix CVE-2025-57529?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-57529?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST