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CVE-2025-63219

HIGHCVSS 7.5/10EPSS 0.39%

Last modified

CVE-2025-63219 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. The ITEL ISO FM SFN Adapter (firmware ISO2 2.0.0.0, WebServer 2.0) is vulnerable to session hijacking due to improper session management on the /home.html endpoint. An attacker can access an active session without authentication, allowing them to control the device, modify configurations, and compromise system integrity.. EPSS estimates a 0.39% chance of exploitation in the next 30 days.

Description

The ITEL ISO FM SFN Adapter (firmware ISO2 2.0.0.0, WebServer 2.0) is vulnerable to session hijacking due to improper session management on the /home.html endpoint. An attacker can access an active session without authentication, allowing them to control the device, modify configurations, and compromise system integrity.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.39%

31.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ItelIso-Fm Firmware2.0.0.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-63219?
The ITEL ISO FM SFN Adapter (firmware ISO2 2.0.0.0, WebServer 2.0) is vulnerable to session hijacking due to improper session management on the /home.html endpoint. An attacker can access an active session without authentication, allowing them to control the device, modify configurations, and compromise system integrity.
How severe is CVE-2025-63219?
CVE-2025-63219 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.39% probability of exploitation in the next 30 days.
How do I fix CVE-2025-63219?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-63219?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST