CVE-2025-63927

MEDIUMCVSS 4/10EPSS 0.17%

Last modified

CVE-2025-63927 is a medium-severity vulnerability rated 4/10 on the CVSS scale. A heap-use-after-free vulnerability exists in airpig2011 IEC104 thru Commit be6d841 (2019-07-08). During multi-threaded client execution, the function Iec10x_Scheduled can access memory that has already been freed, potentially causing program crashes or undefined behavior. EPSS estimates a 0.17% chance of exploitation in the next 30 days.

Description

A heap-use-after-free vulnerability exists in airpig2011 IEC104 thru Commit be6d841 (2019-07-08). During multi-threaded client execution, the function Iec10x_Scheduled can access memory that has already been freed, potentially causing program crashes or undefined behavior. This may be exploited to trigger a denial-of-service or memory corruption.

Metrics

CVSS 3.1
4/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:L

EPSS Probability
0.17%

6.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
Airpig2011Iec104<= 2019-07-08

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-63927?
A heap-use-after-free vulnerability exists in airpig2011 IEC104 thru Commit be6d841 (2019-07-08). During multi-threaded client execution, the function Iec10x_Scheduled can access memory that has already been freed, potentially causing program crashes or undefined behavior. This may be exploited to trigger a denial-of-service or memory corruption.
How severe is CVE-2025-63927?
CVE-2025-63927 has a CVSS score of 4/10 (MEDIUM severity). The EPSS model estimates a 0.17% probability of exploitation in the next 30 days.
How do I fix CVE-2025-63927?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-63927?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST