CVE-2025-7175

LOWCVSS 2.1/10EPSS 0.36%

Last modified

CVE-2025-7175 is a low-severity vulnerability rated 2.1/10 on the CVSS scale. A vulnerability was found in code-projects E-Commerce Site 1.0. It has been classified as critical. EPSS estimates a 0.36% chance of exploitation in the next 30 days.

Description

A vulnerability was found in code-projects E-Commerce Site 1.0. It has been classified as critical. Affected is an unknown function of the file /admin/users_photo.php. The manipulation of the argument photo leads to unrestricted upload. It is possible to launch the attack remotely. The exploit has been disclosed to the public and may be used.

Metrics

CVSS 3.1
7.2/10

CVSS:3.1/AV:N/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

CVSS 4.0
2.1/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:L/UI:N/VC:L/VI:L/VA:L/SC:N/SI:N/SA:N/E:P/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.36%

28.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
FabianE-Commerce Site1.0

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2025-7175?
A vulnerability was found in code-projects E-Commerce Site 1.0. It has been classified as critical. Affected is an unknown function of the file /admin/users_photo.php. The manipulation of the argument photo leads to unrestricted upload. It is possible to launch the attack remotely. The exploit has been disclosed to the public and may be used.
How severe is CVE-2025-7175?
CVE-2025-7175 has a CVSS score of 2.1/10 (LOW severity). The EPSS model estimates a 0.36% probability of exploitation in the next 30 days.
How do I fix CVE-2025-7175?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-7175?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST