CVE-2025-7425

HIGHCVSS 7.8/10EPSS 0.34%

Last modified

CVE-2025-7425 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A flaw was found in libxslt where the attribute type, atype, flags are modified in a way that corrupts internal memory management. When XSLT functions, such as the key() process, result in tree fragments, this corruption prevents the proper cleanup of ID attributes. EPSS estimates a 0.34% chance of exploitation in the next 30 days.

Description

A flaw was found in libxslt where the attribute type, atype, flags are modified in a way that corrupts internal memory management. When XSLT functions, such as the key() process, result in tree fragments, this corruption prevents the proper cleanup of ID attributes. As a result, the system may access freed memory, causing crashes or enabling attackers to trigger heap corruption.

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:H/PR:N/UI:N/S:C/C:N/I:H/A:H

EPSS Probability
0.34%

25.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2025-7425?
A flaw was found in libxslt where the attribute type, atype, flags are modified in a way that corrupts internal memory management. When XSLT functions, such as the key() process, result in tree fragments, this corruption prevents the proper cleanup of ID attributes. As a result, the system may access freed memory, causing crashes or enabling attackers to trigger heap corruption.
How severe is CVE-2025-7425?
CVE-2025-7425 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 0.34% probability of exploitation in the next 30 days.
How do I fix CVE-2025-7425?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-7425?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST