CVE-2025-7693

CRITICALCVSS 9.3/10EPSS 0.34%

Last modified

CVE-2025-7693 is a critical-severity vulnerability rated 9.3/10 on the CVSS scale. A security issue exists due to improper handling of malformed CIP Forward Close packets during fuzzing. The controller enters a solid red Fault LED state and becomes unresponsive. EPSS estimates a 0.34% chance of exploitation in the next 30 days.

Description

A security issue exists due to improper handling of malformed CIP Forward Close packets during fuzzing. The controller enters a solid red Fault LED state and becomes unresponsive. Upon power cycle, the controller will enter recoverable fault where the MS LED and Fault LED become flashing red and reports fault code 0xF015. To recover, clear the fault.

Metrics

CVSS 4.0
9.3/10

CVSS:4.0/AV:N/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.34%

26.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2025-7693?
A security issue exists due to improper handling of malformed CIP Forward Close packets during fuzzing. The controller enters a solid red Fault LED state and becomes unresponsive. Upon power cycle, the controller will enter recoverable fault where the MS LED and Fault LED become flashing red and reports fault code 0xF015. To recover, clear the fault.
How severe is CVE-2025-7693?
CVE-2025-7693 has a CVSS score of 9.3/10 (CRITICAL severity). The EPSS model estimates a 0.34% probability of exploitation in the next 30 days.
How do I fix CVE-2025-7693?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-7693?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST