CVE-2026-0723

HIGHCVSS 7.4/10EPSS 0.83%

Last modified

CVE-2026-0723 is a high-severity vulnerability rated 7.4/10 on the CVSS scale. GitLab has remediated an issue in GitLab CE/EE affecting all versions from 18.6 before 18.6.4, 18.7 before 18.7.2, and 18.8 before 18.8.2 that could have allowed an individual with existing knowledge of a victim's credential ID to bypass two-factor authentication by submitting forged device responses.. EPSS estimates a 0.83% chance of exploitation in the next 30 days.

Description

GitLab has remediated an issue in GitLab CE/EE affecting all versions from 18.6 before 18.6.4, 18.7 before 18.7.2, and 18.8 before 18.8.2 that could have allowed an individual with existing knowledge of a victim's credential ID to bypass two-factor authentication by submitting forged device responses.

Metrics

CVSS 3.1
7.4/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:N

EPSS Probability
0.83%

53.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GitlabGitlab>= 18.6.0, < 18.6.4
GitlabGitlab>= 18.7.0, < 18.7.2
GitlabGitlab>= 18.8.0, < 18.8.2

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2026-0723?
GitLab has remediated an issue in GitLab CE/EE affecting all versions from 18.6 before 18.6.4, 18.7 before 18.7.2, and 18.8 before 18.8.2 that could have allowed an individual with existing knowledge of a victim's credential ID to bypass two-factor authentication by submitting forged device responses.
How severe is CVE-2026-0723?
CVE-2026-0723 has a CVSS score of 7.4/10 (HIGH severity). The EPSS model estimates a 0.83% probability of exploitation in the next 30 days.
How do I fix CVE-2026-0723?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2026-0723?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST