CVE-2026-41705

HIGHCVSS 8.6/10EPSS 0.35%

Last modified

CVE-2026-41705 is a high-severity vulnerability rated 8.6/10 on the CVSS scale. Spring AI's MilvusVectorStore#doDelete(List) implementation is vulnerable to filter-expression injection via unsanitized document IDs. Spring AI 1.0.x: affected from 1.0.0 through latest 1.0.x; upgrade to 1.0.7 or greater. Spring AI 1.1.x: affected from 1.1.0 through latest 1.1.x; upgrade to 1.1.6 or greater.. EPSS estimates a 0.35% chance of exploitation in the next 30 days.

Description

Spring AI's MilvusVectorStore#doDelete(List) implementation is vulnerable to filter-expression injection via unsanitized document IDs. Spring AI 1.0.x: affected from 1.0.0 through latest 1.0.x; upgrade to 1.0.7 or greater. Spring AI 1.1.x: affected from 1.1.0 through latest 1.1.x; upgrade to 1.1.6 or greater.

Metrics

CVSS 3.1
8.6/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:L/A:L

EPSS Probability
0.35%

27.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
VmwareSpring Ai>= 1.0.0, < 1.0.7
VmwareSpring Ai>= 1.1.0, < 1.1.6

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2026-41705?
Spring AI's MilvusVectorStore#doDelete(List) implementation is vulnerable to filter-expression injection via unsanitized document IDs. Spring AI 1.0.x: affected from 1.0.0 through latest 1.0.x; upgrade to 1.0.7 or greater. Spring AI 1.1.x: affected from 1.1.0 through latest 1.1.x; upgrade to 1.1.6 or greater.
How severe is CVE-2026-41705?
CVE-2026-41705 has a CVSS score of 8.6/10 (HIGH severity). The EPSS model estimates a 0.35% probability of exploitation in the next 30 days.
How do I fix CVE-2026-41705?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2026-41705?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST