CVE-2026-43154

MEDIUMCVSS 5.5/10EPSS 0.13%

Last modified

CVE-2026-43154 is a medium-severity vulnerability rated 5.5/10 on the CVSS scale. In the Linux kernel, the following vulnerability has been resolved: erofs: fix incorrect early exits in volume label handling Crafted EROFS images containing valid volume labels can trigger incorrect early returns, leading to folio reference leaks. However, this does not cause system crashes or other severe issues.. EPSS estimates a 0.13% chance of exploitation in the next 30 days.

Description

In the Linux kernel, the following vulnerability has been resolved: erofs: fix incorrect early exits in volume label handling Crafted EROFS images containing valid volume labels can trigger incorrect early returns, leading to folio reference leaks. However, this does not cause system crashes or other severe issues.

Metrics

CVSS 3.1
5.5/10

CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.13%

2.6th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
LinuxLinux Kernel>= 6.18, < 6.18.16
LinuxLinux Kernel>= 6.19, < 6.19.6

References

Timeline

Published
Last Modified
Status
Analyzed

Frequently Asked Questions

What is CVE-2026-43154?
In the Linux kernel, the following vulnerability has been resolved: erofs: fix incorrect early exits in volume label handling Crafted EROFS images containing valid volume labels can trigger incorrect early returns, leading to folio reference leaks. However, this does not cause system crashes or other severe issues.
How severe is CVE-2026-43154?
CVE-2026-43154 has a CVSS score of 5.5/10 (MEDIUM severity). The EPSS model estimates a 0.13% probability of exploitation in the next 30 days.
How do I fix CVE-2026-43154?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2026-43154?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST