CVE-2026-44586

HIGHCVSS 8.3/10EPSS 0.31%

Last modified

CVE-2026-44586 is a high-severity vulnerability rated 8.3/10 on the CVSS scale. SiYuan is an open-source personal knowledge management system. From 2.1.12 to before 3.7.0. EPSS estimates a 0.31% chance of exploitation in the next 30 days.

Description

SiYuan is an open-source personal knowledge management system. From 2.1.12 to before 3.7.0. SiYuan's Bazaar marketplace renders package author metadata from the public bazaar stage feed into HTML without escaping. In the desktop app this becomes stored XSS, and because SiYuan's Electron windows are created with nodeIntegration: true and contextIsolation: false, a successful payload can call Node.js APIs and execute code on the host. This vulnerability is fixed in 3.7.0.

Metrics

CVSS 3.1
8.3/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:R/S:C/C:H/I:H/A:H

EPSS Probability
0.31%

22.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

References

Timeline

Published
Last Modified
Status
Deferred

Frequently Asked Questions

What is CVE-2026-44586?
SiYuan is an open-source personal knowledge management system. From 2.1.12 to before 3.7.0. SiYuan's Bazaar marketplace renders package author metadata from the public bazaar stage feed into HTML without escaping. In the desktop app this becomes stored XSS, and because SiYuan's Electron windows are created with nodeIntegration: true and contextIsolation: false, a successful payload can call Node.js APIs and execute code on the host. This vulnerability is fixed in 3.7.0.
How severe is CVE-2026-44586?
CVE-2026-44586 has a CVSS score of 8.3/10 (HIGH severity). The EPSS model estimates a 0.31% probability of exploitation in the next 30 days.
How do I fix CVE-2026-44586?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2026-44586?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST