CVE-2026-56135

HIGHCVSS 7.4/10EPSS 0.10%

Last modified

CVE-2026-56135 is a high-severity vulnerability rated 7.4/10 on the CVSS scale. In NTFS-3G through 2026.2.25, a heap-based buffer overflow exists in the function build_inherited_id() in libntfs-3g/security.c that allows an attacker to corrupt heap memory in the SUID-root ntfs-3g binary by crafting a malicious NTFS image. The overflow is triggered by creating a file in a crafted directory.. EPSS estimates a 0.10% chance of exploitation in the next 30 days.

Description

In NTFS-3G through 2026.2.25, a heap-based buffer overflow exists in the function build_inherited_id() in libntfs-3g/security.c that allows an attacker to corrupt heap memory in the SUID-root ntfs-3g binary by crafting a malicious NTFS image. The overflow is triggered by creating a file in a crafted directory.

Metrics

EPSS Probability
0.10%

1.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Source: CNA advisory (CVE.org). NVD analysis pending.

VendorProductVersions
——n/a

References

Timeline

Published
Last Modified
Status
Awaiting Analysis

Frequently Asked Questions

What is CVE-2026-56135?
In NTFS-3G through 2026.2.25, a heap-based buffer overflow exists in the function build_inherited_id() in libntfs-3g/security.c that allows an attacker to corrupt heap memory in the SUID-root ntfs-3g binary by crafting a malicious NTFS image. The overflow is triggered by creating a file in a crafted directory.
How severe is CVE-2026-56135?
CVE-2026-56135 has a CVSS score of 7.4/10 (HIGH severity). The EPSS model estimates a 0.10% probability of exploitation in the next 30 days.
How do I fix CVE-2026-56135?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

How Strix Helps

Related CVEs from 2026

Are you affected by CVE-2026-56135?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST