CVE-2026-65309

HIGHCVSS 7.5/10EPSS 0.15%

Last modified

CVE-2026-65309 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. ANDRITZ HIPASE-250 (formerly 250 SCALA) in affected versions stores and transmits user passwords using a reversible format instead of a one-way password hash. This allows an attacker able to read the credential store or capture network traffic to recover all stored passwords.. EPSS estimates a 0.15% chance of exploitation in the next 30 days.

Description

ANDRITZ HIPASE-250 (formerly 250 SCALA) in affected versions stores and transmits user passwords using a reversible format instead of a one-way password hash. This allows an attacker able to read the credential store or capture network traffic to recover all stored passwords.

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability
0.15%

4.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Source: CNA advisory (CVE.org). NVD analysis pending.

VendorProductVersions
ANDRITZHIPASE-250<= 7.20
ANDRITZ250 SCALA<= 7.20

References

Timeline

Published
Last Modified
Status
Received

Frequently Asked Questions

What is CVE-2026-65309?
ANDRITZ HIPASE-250 (formerly 250 SCALA) in affected versions stores and transmits user passwords using a reversible format instead of a one-way password hash. This allows an attacker able to read the credential store or capture network traffic to recover all stored passwords.
How severe is CVE-2026-65309?
CVE-2026-65309 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.15% probability of exploitation in the next 30 days.
How do I fix CVE-2026-65309?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

How Strix Helps

Related CVEs from 2026

Are you affected by CVE-2026-65309?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST