CVE-2026-69005
UnknownEPSS 0.14%
Last modified
CVE-2026-69005 is a vulnerability of currently unknown severity. Integer overflow in NPU driver parameter processing due to insufficient bounds checking.. EPSS estimates a 0.14% chance of exploitation in the next 30 days.
Description
Integer overflow in NPU driver parameter processing due to insufficient bounds checking.
Metrics
Weakness Enumeration
Affected Software
Source: CNA advisory (CVE.org). NVD analysis pending.
| Vendor | Product | Versions |
|---|---|---|
| Samsung Semiconductor | Exynos 1480 | < November 2026 |
| Samsung Semiconductor | Exynos 2400 | < November 2026 |
| Samsung Semiconductor | Exynos 1580 | < November 2026 |
| Samsung Semiconductor | Exynos 2500 | < November 2026 |
| Samsung Semiconductor | Exynos 2600 | < November 2026 |
| Samsung Semiconductor | Exynos 1680 | < November 2026 |
References
Timeline
- Published
- Last Modified
- Status
- Deferred
Frequently Asked Questions
What is CVE-2026-69005?
Integer overflow in NPU driver parameter processing due to insufficient bounds checking.
How severe is CVE-2026-69005?
Severity scoring for CVE-2026-69005 is pending analysis. The EPSS model estimates a 0.14% probability of exploitation in the next 30 days.
How do I fix CVE-2026-69005?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
How Strix Helps
- How Strix found a critical auth bypass in etcdStrix autonomously discovered a critical authentication bypass in etcd, later designated CVE-2026-33413.
- Autonomous PentestingAI agents that find and validate exploitable vulnerabilities like this one across your applications.
- PR ReviewsPentest every pull request so vulnerable code is caught before it ships to production.
- AI Penetration TestingHow AI-driven penetration testing continuously covers your attack surface.
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Are you affected by CVE-2026-69005?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST