CVE-2017-15329

Name: CVE-2017-15329
Creator: NVD / NIST
Published: 2018-02-15T16:29:00.203+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.92%

Last modified Jun 17, 2026

CVE-2017-15329 is a vulnerability of currently unknown severity. Huawei UMA V200R001C00 has a SQL injection vulnerability in the operation and maintenance module. An attacker logs in to the system as a common user and sends crafted HTTP requests that contain malicious SQL statements to the affected system. EPSS estimates a 0.92% chance of exploitation in the next 30 days.

Description

Huawei UMA V200R001C00 has a SQL injection vulnerability in the operation and maintenance module. An attacker logs in to the system as a common user and sends crafted HTTP requests that contain malicious SQL statements to the affected system. Due to a lack of input validation on HTTP requests that contain user-supplied input, successful exploitation may allow the attacker to execute arbitrary SQL queries.

Metrics

EPSS Probability

0.92%

55.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-89

Affected Software

Vendor	Product	Versions
Huawei	Uma Firmware	v200r001c00

References

http://www.huawei.com/en/psirt/security-advisories/2017/huawei-sa-20171116-01-uma-enVendor Advisory
http://www.huawei.com/en/psirt/security-advisories/2017/huawei-sa-20171116-01-uma-enVendor Advisory

Timeline

Published: Feb 15, 2018
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-15329?

How severe is CVE-2017-15329?

Severity scoring for CVE-2017-15329 is pending analysis. The EPSS model estimates a 0.92% probability of exploitation in the next 30 days.

How do I fix CVE-2017-15329?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-15329?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST