CVE-2017-15330

UnknownEPSS 0.56%

Last modified

CVE-2017-15330 is a vulnerability of currently unknown severity. The Flp Driver in some Huawei smartphones of the software Vicky-AL00AC00B124D, Vicky-AL00AC00B157D, Vicky-AL00AC00B167 has a double free vulnerability. An attacker can trick a user to install a malicious application which has a high privilege to exploit this vulnerability. EPSS estimates a 0.56% chance of exploitation in the next 30 days.

Description

The Flp Driver in some Huawei smartphones of the software Vicky-AL00AC00B124D, Vicky-AL00AC00B157D, Vicky-AL00AC00B167 has a double free vulnerability. An attacker can trick a user to install a malicious application which has a high privilege to exploit this vulnerability. Successful exploitation may cause denial of service (DoS) attack.

Metrics

EPSS Probability
0.56%

42.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
HuaweiVicky-Al00a Firmwarevicky-al00ac00b124d
HuaweiVicky-Al00a Firmwarevicky-al00ac00b157d
HuaweiVicky-Al00a Firmwarevicky-al00ac00b167

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-15330?
The Flp Driver in some Huawei smartphones of the software Vicky-AL00AC00B124D, Vicky-AL00AC00B157D, Vicky-AL00AC00B167 has a double free vulnerability. An attacker can trick a user to install a malicious application which has a high privilege to exploit this vulnerability. Successful exploitation may cause denial of service (DoS) attack.
How severe is CVE-2017-15330?
Severity scoring for CVE-2017-15330 is pending analysis. The EPSS model estimates a 0.56% probability of exploitation in the next 30 days.
How do I fix CVE-2017-15330?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-15330?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST