CVE-2017-18651

Name: CVE-2017-18651
Creator: NVD / NIST
Published: 2020-04-07T16:15:15.277+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.5/10EPSS 0.41%

Last modified Jun 17, 2026

CVE-2017-18651 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. An issue was discovered on Samsung mobile devices with M(6.x) and N(7.x) software. There is an Integer Overflow in process_M_SetTokenTUIPasswd during handling of a trusted application, leading to memory corruption. EPSS estimates a 0.41% chance of exploitation in the next 30 days.

Description

An issue was discovered on Samsung mobile devices with M(6.x) and N(7.x) software. There is an Integer Overflow in process_M_SetTokenTUIPasswd during handling of a trusted application, leading to memory corruption. The Samsung IDs are SVE-2017-9008 and SVE-2017-9009 (October 2017).

Metrics

CVSS 3.1

7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability

0.41%

33.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-190

Affected Software

Vendor	Product	Versions
Google	Android	6.0
Google	Android	6.0.1
Google	Android	7.0
Google	Android	7.1.0
Google	Android	7.1.1
Google	Android	7.1.2

References

https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory

Timeline

Published: Apr 7, 2020
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-18651?

How severe is CVE-2017-18651?

CVE-2017-18651 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.41% probability of exploitation in the next 30 days.

How do I fix CVE-2017-18651?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-18651?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST