CVE-2017-18655

Name: CVE-2017-18655
Creator: NVD / NIST
Published: 2020-04-07T16:15:15.527+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

CRITICALCVSS 9.8/10EPSS 0.44%

Last modified Jun 17, 2026

CVE-2017-18655 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. An issue was discovered on Samsung mobile devices with M(6.0) and N(7.x) software. There is a stack-based buffer overflow with resultant memory corruption in a trustlet. EPSS estimates a 0.44% chance of exploitation in the next 30 days.

Description

An issue was discovered on Samsung mobile devices with M(6.0) and N(7.x) software. There is a stack-based buffer overflow with resultant memory corruption in a trustlet. The Samsung IDs are SVE-2017-8889, SVE-2017-8891, and SVE-2017-8892 (August 2017).

Metrics

CVSS 3.1

9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

0.44%

35.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-787

Affected Software

Vendor	Product	Versions
Google	Android	6.0
Google	Android	7.0
Google	Android	7.1.0
Google	Android	7.1.1
Google	Android	7.1.2

References

https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory

Timeline

Published: Apr 7, 2020
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-18655?

How severe is CVE-2017-18655?

CVE-2017-18655 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 0.44% probability of exploitation in the next 30 days.

How do I fix CVE-2017-18655?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-18655?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST