CVE-2017-6317
UnknownEPSS 0.36%
Last modified
CVE-2017-6317 is a vulnerability of currently unknown severity. Memory leak in the add_shader_program function in vrend_renderer.c in virglrenderer before 0.6.0 allows local guest OS users to cause a denial of service (host memory consumption) via vectors involving the sprog variable.. EPSS estimates a 0.36% chance of exploitation in the next 30 days.
Description
Memory leak in the add_shader_program function in vrend_renderer.c in virglrenderer before 0.6.0 allows local guest OS users to cause a denial of service (host memory consumption) via vectors involving the sprog variable.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Virglrenderer Project | Virglrenderer | <= 0.5.0 |
References
- http://www.openwall.com/lists/oss-security/2017/02/24/5Mailing List, Patch
- http://www.securityfocus.com/bid/96450Third Party Advisory, VDB Entry
- https://bugzilla.redhat.com/show_bug.cgi?id=1426756Issue Tracking, Patch
- http://www.openwall.com/lists/oss-security/2017/02/24/5Mailing List, Patch
- http://www.securityfocus.com/bid/96450Third Party Advisory, VDB Entry
- https://bugzilla.redhat.com/show_bug.cgi?id=1426756Issue Tracking, Patch
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2017-6317?
Memory leak in the add_shader_program function in vrend_renderer.c in virglrenderer before 0.6.0 allows local guest OS users to cause a denial of service (host memory consumption) via vectors involving the sprog variable.
How severe is CVE-2017-6317?
Severity scoring for CVE-2017-6317 is pending analysis. The EPSS model estimates a 0.36% probability of exploitation in the next 30 days.
How do I fix CVE-2017-6317?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2017-6317?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
