CVE-2017-6319
UnknownEPSS 1.24%
Last modified
CVE-2017-6319 is a vulnerability of currently unknown severity. The dex_parse_debug_item function in libr/bin/p/bin_dex.c in radare2 1.2.1 allows remote attackers to cause a denial of service (buffer overflow and application crash) or possibly have unspecified other impact via a crafted DEX file.. EPSS estimates a 1.24% chance of exploitation in the next 30 days.
Description
The dex_parse_debug_item function in libr/bin/p/bin_dex.c in radare2 1.2.1 allows remote attackers to cause a denial of service (buffer overflow and application crash) or possibly have unspecified other impact via a crafted DEX file.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Radare | Radare2 | 1.2.1 |
References
- https://github.com/radare/radare2/commit/ad55822430a03fe075221b543efb434567e9e431Issue Tracking, Patch, Third Party Advisory
- https://github.com/radare/radare2/issues/6836Issue Tracking, Patch, Third Party Advisory
- https://github.com/radare/radare2/commit/ad55822430a03fe075221b543efb434567e9e431Issue Tracking, Patch, Third Party Advisory
- https://github.com/radare/radare2/issues/6836Issue Tracking, Patch, Third Party Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2017-6319?
The dex_parse_debug_item function in libr/bin/p/bin_dex.c in radare2 1.2.1 allows remote attackers to cause a denial of service (buffer overflow and application crash) or possibly have unspecified other impact via a crafted DEX file.
How severe is CVE-2017-6319?
Severity scoring for CVE-2017-6319 is pending analysis. The EPSS model estimates a 1.24% probability of exploitation in the next 30 days.
How do I fix CVE-2017-6319?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2017-6319?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST