CVE-2019-18261

CRITICALCVSS 9.8/10EPSS 1.31%

Last modified

CVE-2019-18261 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. In Omron PLC CS series, all versions, Omron PLC CJ series, all versions, and Omron PLC NJ series, all versions, the software does not implement sufficient measures to prevent multiple failed authentication attempts within in a short time frame, making it more susceptible to brute force attacks.. EPSS estimates a 1.31% chance of exploitation in the next 30 days.

Description

In Omron PLC CS series, all versions, Omron PLC CJ series, all versions, and Omron PLC NJ series, all versions, the software does not implement sufficient measures to prevent multiple failed authentication attempts within in a short time frame, making it more susceptible to brute force attacks.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
1.31%

66.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
OmronPlc Cj FirmwareAll versions
OmronPlc Cs FirmwareAll versions
OmronPlc Nj FirmwareAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2019-18261?
In Omron PLC CS series, all versions, Omron PLC CJ series, all versions, and Omron PLC NJ series, all versions, the software does not implement sufficient measures to prevent multiple failed authentication attempts within in a short time frame, making it more susceptible to brute force attacks.
How severe is CVE-2019-18261?
CVE-2019-18261 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 1.31% probability of exploitation in the next 30 days.
How do I fix CVE-2019-18261?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2019-18261?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST