CVE-2021-21731

HIGHCVSS 8.1/10EPSS 0.39%

Last modified

CVE-2021-21731 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. A CSRF vulnerability exists in the management page of a ZTE product.The vulnerability is caused because the management page does not fully verify whether the request comes from a trusted user. The attacker could submit a malicious request to the affected device to delete the data. EPSS estimates a 0.39% chance of exploitation in the next 30 days.

Description

A CSRF vulnerability exists in the management page of a ZTE product.The vulnerability is caused because the management page does not fully verify whether the request comes from a trusted user. The attacker could submit a malicious request to the affected device to delete the data. This affects: ZXCLOUD iRAI All versions up to KVM-ProductV6.03.04

Metrics

CVSS 3.1
8.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:R/S:U/C:N/I:H/A:H

EPSS Probability
0.39%

30.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ZteZxcloud Irai< 6.03.04

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-21731?
A CSRF vulnerability exists in the management page of a ZTE product.The vulnerability is caused because the management page does not fully verify whether the request comes from a trusted user. The attacker could submit a malicious request to the affected device to delete the data. This affects: ZXCLOUD iRAI All versions up to KVM-ProductV6.03.04
How severe is CVE-2021-21731?
CVE-2021-21731 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 0.39% probability of exploitation in the next 30 days.
How do I fix CVE-2021-21731?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-21731?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST