CVE-2021-21732

Name: CVE-2021-21732
Creator: NVD / NIST
Published: 2021-05-19T11:15:07.757+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 7.5/10EPSS 1.00%

Last modified Jun 17, 2026

CVE-2021-21732 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. A mobile phone of ZTE is impacted by improper access control vulnerability. Due to improper permission settings, third-party applications can read some files in the proc file system without authorization. EPSS estimates a 1.00% chance of exploitation in the next 30 days.

Description

A mobile phone of ZTE is impacted by improper access control vulnerability. Due to improper permission settings, third-party applications can read some files in the proc file system without authorization. Attackers could exploit this vulnerability to obtain sensitive information. This affects Axon 11 5G ZTE/CN_P725A12/P725A12:10/QKQ1.200816.002/20201116.175317:user/release-keys.

Metrics

CVSS 3.1

7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:N/A:N

EPSS Probability

1.00%

58.5th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

Vendor	Product	Versions
Zte	Axon 11 5g Firmware	< 2021.5.1

References

https://support.zte.com.cn/support/news/LoopholeInfoDetail.aspx?newsId=1015064Vendor Advisory
https://support.zte.com.cn/support/news/LoopholeInfoDetail.aspx?newsId=1015064Vendor Advisory

Timeline

Published: May 19, 2021
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2021-21732?

How severe is CVE-2021-21732?

CVE-2021-21732 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 1.00% probability of exploitation in the next 30 days.

How do I fix CVE-2021-21732?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-21732?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST