CVE-2021-37179

HIGHCVSS 7.8/10EPSS 1.38%

Last modified

CVE-2021-37179 is a high-severity vulnerability rated 7.8/10 on the CVSS scale. A vulnerability has been identified in Solid Edge SE2021 (All Versions < SE2021MP7). The PSKERNEL.dll library in affected application lacks proper validation while parsing user-supplied OBJ files that could lead to a use-after-free condition. EPSS estimates a 1.38% chance of exploitation in the next 30 days.

Description

A vulnerability has been identified in Solid Edge SE2021 (All Versions < SE2021MP7). The PSKERNEL.dll library in affected application lacks proper validation while parsing user-supplied OBJ files that could lead to a use-after-free condition. An attacker could leverage this vulnerability to execute code in the context of the current process. (ZDI-CAN-13777)

Metrics

CVSS 3.1
7.8/10

CVSS:3.1/AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

EPSS Probability
1.38%

68.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SiemensSolid Edge Se2021 Firmware< se2021mp7

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2021-37179?
A vulnerability has been identified in Solid Edge SE2021 (All Versions < SE2021MP7). The PSKERNEL.dll library in affected application lacks proper validation while parsing user-supplied OBJ files that could lead to a use-after-free condition. An attacker could leverage this vulnerability to execute code in the context of the current process. (ZDI-CAN-13777)
How severe is CVE-2021-37179?
CVE-2021-37179 has a CVSS score of 7.8/10 (HIGH severity). The EPSS model estimates a 1.38% probability of exploitation in the next 30 days.
How do I fix CVE-2021-37179?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2021-37179?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST