CVE-2022-4666

MEDIUMCVSS 5.4/10EPSS 0.47%

Last modified

CVE-2022-4666 is a medium-severity vulnerability rated 5.4/10 on the CVSS scale. The Markup (JSON-LD) structured in schema.org WordPress plugin through 4.8.1 does not validate and escape some of its shortcode attributes before outputting them back in a page/post where the shortcode is embed, which could allow users with the contributor role and above to perform Stored Cross-Site Scripting attacks.. EPSS estimates a 0.47% chance of exploitation in the next 30 days.

Description

The Markup (JSON-LD) structured in schema.org WordPress plugin through 4.8.1 does not validate and escape some of its shortcode attributes before outputting them back in a page/post where the shortcode is embed, which could allow users with the contributor role and above to perform Stored Cross-Site Scripting attacks.

Metrics

CVSS 3.1
5.4/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:R/S:C/C:L/I:L/A:N

EPSS Probability
0.47%

37.2th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
TerakoyaMarkup \(Json-Ld\) Structured In Schema.Org<= 4.8.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2022-4666?
The Markup (JSON-LD) structured in schema.org WordPress plugin through 4.8.1 does not validate and escape some of its shortcode attributes before outputting them back in a page/post where the shortcode is embed, which could allow users with the contributor role and above to perform Stored Cross-Site Scripting attacks.
How severe is CVE-2022-4666?
CVE-2022-4666 has a CVSS score of 5.4/10 (MEDIUM severity). The EPSS model estimates a 0.47% probability of exploitation in the next 30 days.
How do I fix CVE-2022-4666?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2022-4666?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST