CVE-2025-66590

HIGHCVSS 8.4/10EPSS 0.31%

Last modified

CVE-2025-66590 is a high-severity vulnerability rated 8.4/10 on the CVSS scale. In AzeoTech DAQFactory release 20.7 (Build 2555), an out-of-bounds write vulnerability can be exploited by an attacker to cause the program to write data past the end of an allocated memory buffer. This can lead to arbitrary code execution or a system crash.. EPSS estimates a 0.31% chance of exploitation in the next 30 days.

Description

In AzeoTech DAQFactory release 20.7 (Build 2555), an out-of-bounds write vulnerability can be exploited by an attacker to cause the program to write data past the end of an allocated memory buffer. This can lead to arbitrary code execution or a system crash.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

CVSS 4.0
8.4/10

CVSS:4.0/AV:L/AC:L/AT:N/PR:N/UI:A/VC:H/VI:H/VA:H/SC:N/SI:N/SA:N/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:X/AU:X/R:X/V:X/RE:X/U:X

EPSS Probability
0.31%

22.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AzeotechDaqfactory< 21.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2025-66590?
In AzeoTech DAQFactory release 20.7 (Build 2555), an out-of-bounds write vulnerability can be exploited by an attacker to cause the program to write data past the end of an allocated memory buffer. This can lead to arbitrary code execution or a system crash.
How severe is CVE-2025-66590?
CVE-2025-66590 has a CVSS score of 8.4/10 (HIGH severity). The EPSS model estimates a 0.31% probability of exploitation in the next 30 days.
How do I fix CVE-2025-66590?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2025-66590?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST